X-ray scattering method used in spectroscopic quality control of samples with organic composition such as varnish samples, involves using X-ray energy dispersion equipment for scattering X-rays towards sample, and analyzing scattered X-rays
NOVELTY – The method involves scattering the X-rays irradiated from an X-ray source towards the varnish sample for inspection using an X-ray energy dispersion equipment. The X-ray energy dispersion equipment is arranged with an analyzer that has a detector for receiving the scattered X-rays, and an X-ray tube to which 100 volts and 50 microamperes are supplied. A display with predetermined resolution is provided to show the sample analysis results. USE – Used in spectroscopic quality control of samples with organic composition such as varnish samples.
Main Application Field
S03 (Scientific Instrumentation)
INVENTORS:
Bueno Maria Izabel Maretti Silveira
Verbi Fabíola Manhas
54_AMOSTRAS
Patent number: BR200502174-A;BR200502174-B1
PATENT STATUS:
GRANTED
FOR ADDITIONAL INFORMATION:
parcerias@inova.unicamp.br
+55 (19) 3521-5207 / 2607
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