Method for improving electrical contact between nanostructures and metallic electrodes, involves scanning laser with incident power density, performing scanning operation with incident power density, and obtaining current-voltage curve

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Method for improving electrical contact between nanostructures and metallic electrodes, involves scanning laser with incident power density, performing scanning operation with incident power density, and obtaining current-voltage curve

NOVELTY – The method involves directly heating nanostructures with continuous movement laser that is arranged perpendicular to a main axis of a sample to reduce exposure time in the nanostructures and covers the sample. Contact units are arranged between the nanostructures and metallic electrodes. The movement laser is scanned with varying incident power density between 50 and 300 kW / cm2, preferably 200 KW / cm2. A laser scanning operation is performed with varying incident power density between 200 and 700 KW / cm2, preferably 500 KW / cm2. A current-voltage curve is obtained. USE – Method for improving electrical contact between nanostructures and metallic electrodes. ADVANTAGE – The method enables fabricating smaller devices in an accurate manner with reduced energy consumption. The method enables improving flexibility of the nanostructures and metallic electrodes with reduced cost and reduced environmental impacts. DESCRIPTION OF DRAWING(S) – The drawing shows a sectional view illustrating a method for improving electrical contact between metallic electrodes.

Main Application Field

U11 (Semiconductor Materials and Processes); U12 (Discrete Devices)

INVENTORS:

SOUZA ANTÔNIO GOMES FILHO
SILVEIRA JOSÉ VALDENIR DA
SAVU RALUCA
MOSHKALEV STANISLAW

716_CONTATO

Patent number: BR102013020179-A2

PATENT STATUS:

For information contact Inova Unicamp

FOR ADDITIONAL INFORMATION:

parcerias@inova.unicamp.br

+55 (19) 3521-5207 / 2607

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