EDXRF based X ray scanning and chemometry based quantification of silica aluminum

NOVELTY – EDXRF based X ray scanning and chemometry based quantification of silica aluminum contents consists of a non destructive economical technique

Main Application Field

E36 (Non-metallic elements, semi-metals (Se, Te, B, Si) and their compounds (except for E35).); S03 (Scientific Instrumentation)

INVENTORS:

BUENO MARIA IZABEL MARETTI SIL
GORAIEB KAREN
COLLINS KENNETH ELMER

73_ALUMÍNIO

Patent number: BR200502861-A

PATENT STATUS:

GRANTED

FOR ADDITIONAL INFORMATION:

parcerias@inova.unicamp.br

+55 (19) 3521-5207 / 2607