EDXRF based X ray scanning and chemometry based quantification of silica aluminum
NOVELTY – EDXRF based X ray scanning and chemometry based quantification of silica aluminum contents consists of a non destructive economical technique
Main Application Field
E36 (Non-metallic elements, semi-metals (Se, Te, B, Si) and their compounds (except for E35).); S03 (Scientific Instrumentation)
INVENTORS:
BUENO MARIA IZABEL MARETTI SIL
GORAIEB KAREN
COLLINS KENNETH ELMER
73_ALUMÍNIO
Patent number: BR200502861-A
PATENT STATUS:
GRANTED
FOR ADDITIONAL INFORMATION:
parcerias@inova.unicamp.br
+55 (19) 3521-5207 / 2607
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